Control Systemation Inc. (CSI) reports that the United States District Court has entered its Final Consent Judgment against Controlled Semiconductor Inc. ("ConSemi") and Jon W. Heyl ("Heyl"), ending their long-running patent dispute. The Court had previously ruled in August 2008 that ConSemi's FATcat failure analysis tool infringed CSI's U.S. Patent No. 7,271,012 B2, "Failure Analysis Methods and Systems."

According to the Final Consent Judgment, Heyl agreed to be: (1) permanently enjoined from using non-public Confidential Information he learned while employed by CSI; (2) permanently enjoined from filing any new patent applications for inventions relating to CSI's business that were made before his employment was terminated for cause by CSI; (3) permanently enjoined from marketing, offering for sale, importing, selling and using any laser decapsulation apparatus that infringes, or by its operation a user infringes, any claims of CSI's U.S. Patent No. 7,271,012 B2, including the FATcat and any colorable imitation of the FATcat product; and (4)permanently enjoined from challenging validity or enforceability, or voluntarily assisting others in challenging validity or enforceability, of CSI's United States Patent No. 7,271,012 B2.

The parties also entered into a separate confidential settlement agreement, the terms of which may not be disclosed.

Tue Dec 02 07:08:00 CST 2008